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Adding the rest of the matrix scanning modes

Browse source 
- Not tested yet
- Added bug fixes for the scanCol and scanRow methods
- Merged in the powered versions of scanCol and scanRow
- Added the scanDual, but still needs heavy testing
- The scanDual uses twice the memory per key, so it can only scan half
  as much compared to the other scan modes
This commit is contained in:
Jacob Alexander 2011-10-16 20:08:37 -07:00
parent ab9382acf3
commit aa77d5d8a4
3 changed files with 195 additions and 22 deletions
Download patch file Download diff file Expand all files Collapse all files

130
Scan/matrix/matrix_scan.c
View file

@ -37,6 +37,7 @@
// ----- Macros -----
// -- pinSetup Macros --
#define REG_SET(reg) reg |= (1 << ( matrix[row*(MAX_ROW_SIZE+1)+col] % 10 ) )
#define PIN_SET_COL(pin) \
@ -69,9 +70,34 @@
case pin##pinLetter##6: \
case pin##pinLetter##7
// -- Column Scan Macros --
#define PIN_TEST_COL(pin) \
if ( !( pin & ( 1 << ( matrix[0*(MAX_ROW_SIZE+1)+col] % 10 ) ) ) ) \
detectArray[matrix[row*(MAX_ROW_SIZE+1)+col]]++; \
scanCode = matrix[row*(MAX_ROW_SIZE+1)+col]; \
if ( scanCode && !( pin & ( 1 << ( matrix[0*(MAX_ROW_SIZE+1)+col] % 10 ) ) ) ) \
detectArray[scanCode]++; \
break
// -- Row Scan Macros --
#define PIN_TEST_ROW(pin) \
scanCode = matrix[row*(MAX_ROW_SIZE+1)+col]; \
if ( scanCode && !( pin & ( 1 << ( matrix[row*(MAX_ROW_SIZE+1)+0] % 10 ) ) ) ) \
detectArray[scanCode]++; \
break
// -- Scan Dual Macros --
#define PIN_DUALTEST_ROW(pin) \
scanCode = matrix[row*(MAX_ROW_SIZE+1)+col]; \
if ( scanCode \
&& !( pin & ( 1 << ( matrix[row*(MAX_ROW_SIZE+1)+0] % 10 ) ) ) \
&& detectArray[scanCode] & 0x01 ) \
{ \
detectArray[scanCode]++; \
} \
else \
{ \
if ( detectArray[scanCode] & 0x01 ) \
detectArray[scanCode]--; \
} \
break
@ -193,15 +219,21 @@ inline void matrix_pinSetup( uint8_t *matrix )
PORTF = portF;
}
// TODO Proper matrix scanning
// Scans the given matrix determined by the scanMode method
inline void matrix_scan( uint8_t *matrix, uint8_t *detectArray )
{
// Column Scan
#if scanMode == scanCol
// Loop variables for all modes
uint16_t col = 1;
uint16_t row = 1;
for ( ; col < (MAX_ROW_SIZE+1) + 1; col++ )
uint16_t scanCode = 0;
// Column Scan and Column Scan, Power Row
#if scanMode == scanCol || scanMode == scanCol_powrRow
for ( ; row < (MAX_COL_SIZE+1); row++ ) for ( ; col < (MAX_ROW_SIZE+1); col++ )
{
// Scan over the pins for each of the columns, and using the pin alias to determine which pin to set
// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
switch ( matrix[0*(MAX_ROW_SIZE+1)+col] / 10 )
{
#if defined(__AVR_AT90USB1286__)
@ -220,22 +252,88 @@ inline void matrix_scan( uint8_t *matrix, uint8_t *detectArray )
PIN_TEST_COL(PINF);
}
}
#endif
#endif // scanMode
// Row Scan
#if scanMode == scanRow
#endif
// Column Scan, Power Row
#if scanMode == scanCol_powrRow
// Row Scan and Row Scan, Power Row
#if scanMode == scanRow || scanMode == scanRow_powrCol
for ( ; col < (MAX_ROW_SIZE+1); col++ ) for ( ; row < (MAX_COL_SIZE+1); row++ )
{
// Scan over the pins for each of the rows, and using the pin alias to determine which pin to set
// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
switch ( matrix[row*(MAX_ROW_SIZE+1)+0] / 10 )
{
#if defined(__AVR_AT90USB1286__)
case 0: // PINA
PIN_TEST_ROW(PINA);
#endif
case 1: // PINB
PIN_TEST_ROW(PINB);
case 2: // PINC
PIN_TEST_ROW(PINC);
case 3: // PIND
PIN_TEST_ROW(PIND);
case 4: // PINE
PIN_TEST_ROW(PINE);
case 5: // PINF
PIN_TEST_ROW(PINF);
}
}
#endif // scanMode
// Row Scan, Power Column
#if scanMode == scanRow_powrCol
#endif
// Dual Scan
#if scanMode == scanDual
// First do a scan of all of the columns, marking each one
for ( ; row < (MAX_COL_SIZE+1); row++ ) for ( ; col < (MAX_ROW_SIZE+1); col++ )
{
// Scan over the pins for each of the columns, and using the pin alias to determine which pin to set
// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
switch ( matrix[0*(MAX_ROW_SIZE+1)+col] / 10 )
{
#if defined(__AVR_AT90USB1286__)
case 0: // PINA
PIN_TEST_COL(PINA);
#endif
case 1: // PINB
PIN_TEST_COL(PINB);
case 2: // PINC
PIN_TEST_COL(PINC);
case 3: // PIND
PIN_TEST_COL(PIND);
case 4: // PINE
PIN_TEST_COL(PINE);
case 5: // PINF
PIN_TEST_COL(PINF);
}
}
// Next, do a scan of all of the rows, clearing any "vague" keys (only detected on row, but not column, or vice-versa)
// And marking any keys that are detected on the row and column
col = 1;
row = 1;
for ( ; col < (MAX_ROW_SIZE+1); col++ ) for ( ; row < (MAX_COL_SIZE+1); row++ )
{
// Scan over the pins for each of the rows, and using the pin alias to determine which pin to set
// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
switch ( matrix[row*(MAX_ROW_SIZE+1)+0] / 10 )
{
#if defined(__AVR_AT90USB1286__)
case 0: // PINA
PIN_DUALTEST_ROW(PINA);
#endif
case 1: // PINB
PIN_DUALTEST_ROW(PINB);
case 2: // PINC
PIN_DUALTEST_ROW(PINC);
case 3: // PIND
PIN_DUALTEST_ROW(PIND);
case 4: // PINE
PIN_DUALTEST_ROW(PINE);
case 5: // PINF
PIN_DUALTEST_ROW(PINF);
}
}
#endif
}